Rent UB Facilities, Equipment
Rent Facilities for Events and Meeting Spaces
Make your next event memorable and easy to manage. Rent facilities, on campus, that meet your special event needs.
For help in planning your event and locating spaces on campus, contact the Office of Special Events.
William Regan at firstname.lastname@example.org or 716-645-6148.
- For catering information, contact Three Pillars Catering at email@example.com or 716-645-6549.
- To rent spaces in the Center for the Arts, contact 716-645-0891.
Testing Labs and Technical Facilities
Create and maintain product quality by using UB's specialized facilities and equipment to test your products. Fees are determined by the individual units.
- firstname.lastname@example.org or 716-645-4961. Call for hourly rates.
- Bergmann@buffalo.edu or 716-645-4120.
- email@example.com or 716-645-1181.
Focused Ion Beam / Scanning Electron Microscopy Facility (FIB / SEM)Consists of a Zeiss Auriga XBeam focused ion beam/field emission SEM system with TEM liftout, Oxford EDS system, Avizo imaging interface / software for 3D reconstruction of depth profiles. Contact Dr. Yueling Qin at 716-645-2017, ext. 116 or firstname.lastname@example.org
The Clean Room Facility
Provides optical lithography and device processing, fabrication, and testing. Located in Jack & Barabara Davis Hall, the 5,000-square-foot cleanroom combines class-w00 and class-1000 space. A PhD-level manager and associated technician, manage the facility assisted by graduate students.
Major items of equipment within the cleanroom includes furnaces, a thermal evaporator, an electron-beam evaporator, a Karl Suss MJB-3 mask aligner, an ellipsometer, a reactive ion etch for dry patterning, and photoresist system for photoresist deposition. A deionized water system provides the high-purity water required in semiconductor processing. Measurement facilities include optical microscopes, a sub-micron probe station, current-voltage-temperature, capacitance-voltage-temperature, deep level transient spectroscopy, quasi-static C-V, cryogenic systems, and a variety of meters for measuring resistance, current, capacitance and voltage.
Nanolithography capabilities are provided by facilities for electron-beam and focused-ion-beam lithography. Electron-beam lithography is performed using a JEOL JSM 6500F field-emission microscope configured with the Nabity NPGS system. This System is routinely used to create structures with features smaller than 20 nm. This capability has been enhanced by the recent, NSF/MRI-enabled, purchase of a Zeiss Auriga XBeam focused ion beam/scanning electron microscope. Contact David Eason at 716-645-8596 or email@example.com
Electron Beam Lithography Facility (EBL)Major equipment in the facility includes: JEOL JSM6500F Scanning Electron Microscope; Nabity NPGS E-Beam Writing System; CEE Model 100 Spin Coater; Bake Oven. Contact Dr. Yueling Qin at 716-645-2017, ext. 116 or firstname.lastname@example.org
Device BondingA K&S Model 4522 Digital Ball Wire Bonder supports the various fabrication and characterization labs of INSIF. This is a ball-bonder type machine that can store various wire bonding "recipes." It can bond with gold wires from 18-75 microns in diameter. Contact Dr. Albert Titus at 716-645-3115, ext. 1200 or email@example.com
Physical Property Measurement SystemThis facility consists of a Quantum Design Physical Property Measurement system (PPMS) that can make a variety of electrical and magnetic measurements on samples over a broad range of temperatures (down to liquid helium temperature) and in the presence of high applied magnetic field (up to 9 Tesla). Contact Dr. Hao Zeng at 716-645-1019 or firstname.lastname@example.org
Fourier Transform Infrared Spectrocopy FacilityThis facility consists of a Bruker FTIR spectrometer with a MCT detector and mirrors / accessories needed for coupling to an external bolometer as well as for carrying out experiments outside the main chamber. Contact Dr. Andrea Markelz at 716-645-2739 or email@example.com
Atomic Force Microscopy FacilityThis facility consists of a Quesant Resolver AFM typically used for hard materials. This Atomic Force Microscope is capable of scanning large samples (6 in x 6 in x 2 in) and resolving individual atoms. Contact Dr. Yueling Qin at 716-645-2017, ext. 116 or firstname.lastname@example.org
- email@example.com or 716-829-3561. Call for hourly rates.
- firstname.lastname@example.org or 716-645-4364.
- email@example.com or 716-645-2844.
- firstname.lastname@example.org or 716-645-2844.